corner
corner

Phys. Rev. B 81, 035304 (2010) [5 pages]

Cs-induced charge transfer on (2×4)-GaAs(001) studied by photoemission

Download: PDF (433 kB) Buy this article Export: BibTeX or EndNote (RIS)

O. E. Tereshchenko1,*, D. Paget2, P. Chiaradia3, F. Wiame4, and A. Taleb-Ibrahimi5
1Institute of Semiconductor Physics, Novosibirsk State University, 630090 Novosibirsk, Russia
2Laboratoire de Physique de la Matière Condensée, Ecole Polytechnique-CNRS, 91128 Palaiseau Cedex, France
3Dipartimento di Fisica, CNISM Unit and NAST, Universita di Roma Tor Vergata, 00133 Roma, Italy
4Laboratoire de Physico-Chimie des Surfaces, Ecole Nationale Supérieure de Chimie de Paris, 75231 Paris Cedex 05, France
5Synchrotron SOLEIL, Saint Aubin, BP 48, 91192 Gif sur Yvette Cedex, France

Received 27 July 2009; revised 8 October 2009; published 6 January 2010

Cesium adsorption on (2×4)-GaAs(001) was studied by photoemission and low-energy electron diffraction. The different Cs-induced changes of As 3d and Ga 3d core-level spectra show that charge transfer is almost complete for Ga surface sites, but is negligible to surface As at a coverage ΘCs<0.3 ML. The situation becomes opposite for ΘCs>0.3 ML, at which transfer occurs to As but no longer to Ga. Charge transfer to As atoms leads to surface disordering and destabilization and induces surface conversion from As-rich to Ga-rich (4×2)-GaAs(001) surface after annealing at a reduced temperature of 450 °C.

© 2010 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.81.035304
DOI:
10.1103/PhysRevB.81.035304
PACS:
68.43.-h, 79.60.-i, 73.61.Ey, 67.30.hp

*Corresponding author; teresh@thermo.isp.nsc.ru