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Phys. Rev. B 80, 172401 (2009) [4 pages]

Measuring the magnetization of three monolayer thick Co islands and films by x-ray dichroism

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A. Mascaraque1, L. Aballe2, J. F. Marco3, T. O. Menteş2, F. El Gabaly4, C. Klein5, A. K. Schmid5, K. F. McCarty4, A. Locatelli2, and J. de la Figuera3,6
1Departamento de Física de Materiales, Universidad Complutense de Madrid, Madrid 28040, Spain
2Elettra Sincrotrone SCpA, Trieste, Italy
3Departamento de Sistemas de Baja Dimensionalidad, Superficies y Materia Condensada, Instituto de Química-Física “Rocasolano,” CSIC, Madrid 28006, Spain
4Department of Materials Physics, Sandia National Laboratories, Livermore, California 94550, USA
5National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
6Centro de Microanálisis de Materiales, Universidad Autónoma de Madrid, Madrid 28049, Spain

Received 6 February 2009; revised 30 July 2009; published 6 November 2009

Co islands and films are characterized by x-ray magnetic circular dichroism photoemission electron microscopy. The spatial resolution capabilities of the technique together with atomic growth control permit obtaining perfectly flat triangular islands with a given thickness (3 ML), very close to an abrupt spin-reorientation transition. The magnetic domain configurations are found to depend on island size: while small islands can be magnetized in a single-domain state, larger islands show more complex patterns. Furthermore, the magnetization pattern of the larger islands presents a common chirality. By means of dichroic spectromicroscopy at the Co L absorption edges, an experimental estimate of the ratio of the spin and orbital magnetic moment for three monolayer thick films is obtained.

© 2009 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.80.172401
DOI:
10.1103/PhysRevB.80.172401
PACS:
75.75.+a, 75.70.Rf, 87.64.ku, 68.37.Nq