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Phys. Rev. B 80, 115202 (2009) [15 pages]

Diamonds with a high density of nitrogen-vacancy centers for magnetometry applications

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V. M. Acosta1,*, E. Bauch1,2, M. P. Ledbetter1, C. Santori3, K.-M. C. Fu3, P. E. Barclay3, R. G. Beausoleil3, H. Linget4, J. F. Roch5, F. Treussart5, S. Chemerisov6, W. Gawlik7, and D. Budker1,8,†
1Department of Physics, University of California, Berkeley, California 94720-7300, USA
2Technische Universität Berlin, Hardenbergstraße 28, 10623 Berlin, Germany
3Hewlett-Packard Laboratories, 1501 Page Mill Road, Palo Alto, California 94304, USA
4Ecole Normale Supérieure de Cachan, 61 Avenue du Président Wilson, 94235 Cachan Cedex, France
5Laboratoire de Photonique Quantique et Moléculaire (CNRS UMR 8537), Ecole Normale Supérieure de Cachan, 61 Avenue du Président Wilson, 94235 Cachan Cedex, France
6Argonne National Laboratory, Argonne, Illinois 60439, USA
7Center for Magneto-Optical Research, Institute of Physics, Jagiellonian University, Reymonta 4, 30-059 Kraków, Poland
8Nuclear Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

Received 11 April 2009; revised 8 July 2009; published 9 September 2009

Nitrogen-vacancy (NV) centers in millimeter-scale diamond samples were produced by irradiation and subsequent annealing under varied conditions. The optical and spin-relaxation properties of these samples were characterized using confocal microscopy, visible and infrared absorption, and optically detected magnetic resonance. The sample with the highest NV− concentration, approximately 16 ppm (2.8×1018 cm−3), was prepared with no observable traces of neutrally charged vacancy defects. The effective transverse spin-relaxation time for this sample was T2∗=118(48) ns, predominately limited by residual paramagnetic nitrogen which was determined to have a concentration of 49(7) ppm. Under ideal conditions, the shot-noise limited sensitivity is projected to be ∼150 fT/√Hz for a 100 μm-scale magnetometer based on this sample. Other samples with NV− concentrations from 0.007 to 12 ppm and effective relaxation times ranging from 27 to over 291 ns were prepared and characterized.

© 2009 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.80.115202
DOI:
10.1103/PhysRevB.80.115202
PACS:
61.72.jn, 07.55.Ge, 76.30.Mi, 81.05.Uw

*vmacosta@berkeley.edu

†budker@berkeley.edu

 
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