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Phys. Rev. B 79, 205404 (2009) [9 pages]

Gate coupling to nanoscale electronics

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Sujit S. Datta
Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA
and Department of Physics, Harvard University, Cambridge, Massachusetts 02138, USA

Douglas R. Strachan*
Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA
and Department of Physics and Astronomy, University of Kentucky, Lexington, Kentucky 40506, USA

A. T. Charlie Johnson
Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA

Received 16 December 2008; published 7 May 2009

The realization of single-molecule electronic devices, in which a nanometer-scale molecule is connected to macroscopic leads, requires the reproducible production of highly ordered nanoscale gaps in which a molecule of interest is electrostatically coupled to nearby gate electrodes. Understanding how the molecule-gate coupling depends on key parameters is crucial for the development of high-performance devices. Here we directly address this, presenting two- and three-dimensional finite-element electrostatic simulations of the electrode geometries formed using emerging fabrication techniques. We quantify the gate coupling intrinsic to these devices, exploring the roles of parameters believed to be relevant to such devices. These include the thickness and nature of the dielectric used, and the gate screening due to different device geometries. On the single-molecule (∼1 nm) scale, we find that device geometry plays a greater role in the gate coupling than the dielectric constant or the thickness of the insulator. Compared to the typical uniform nanogap electrode geometry envisioned, we find that nonuniform tapered electrodes yield a significant 3 orders of magnitude improvement in gate coupling. We also find that in the tapered geometry the polarizability of a molecular channel works to enhance the gate coupling.

© 2009 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.79.205404
DOI:
10.1103/PhysRevB.79.205404
PACS:
73.40.−c, 73.63.Rt, 85.65.+h

*doug.strachan@uky.edu

cjohnson@physics.upenn.edu