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Phys. Rev. B 78, 075321 (2008) [6 pages]

Heteroepitaxial growth of the intrinsic vacancy semiconductor Al2Se3 on Si(111): Initial structure and morphology

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Chih-Yuan Lu1,2,*, Jonathan A. Adams3,†, Qiuming Yu2, Taisuke Ohta1,2,‡, Marjorie A. Olmstead3,2, and Fumio S. Ohuchi1,2,§
1Department of Materials Science and Engineering, University of Washington, Seattle, Washington 98195-2120, USA
2University of Washington Center for Nanotechnology, Seattle, Washington 98195-2140, USA
3Department of Physics, University of Washington, Seattle, Washington 98195-1560, USA

Received 9 January 2008; published 25 August 2008

The evolution of nanostructure morphology and local chemical environment during heteroepitaxial growth of aluminum selenide on Si(111) was investigated with scanning tunneling microscopy and high-resolution photoemission spectroscopy. Despite the strong similarity to GaSe in atomic and electronic structure during deposition of the first AlSe bilayer, subsequent growth is quite different—resulting in an alternating Al-Se-Al-Se stacking sequence consistent with defected-wurtzite-structure Al2Se3. The first bilayer is completed on a given terrace before the second layer nucleates, but subsequent layers nucleate before completion of the second layer. The surfaces of well-formed AlxSey islands are smooth and terminated by Se atoms; Al then sticks before additional Se, resulting in rougher incomplete islands with Al-rich disordered surfaces. Growth with extra Al in the incident flux does not result in layered AlSe and induces only subtle differences in film morphology.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.78.075321
DOI:
10.1103/PhysRevB.78.075321
PACS:
68.55.ag, 68.35.bg, 68.37.Ef, 79.60.Jv

*Present address: Intel Corporation, 5200 NE Elam Young Parkway, Hillsboro, OR 97124.

Present address: Advanced Portfolios Ltd., London, UK.

Present address: Sandia National Laboratories, Albuquerque, NM.

§ohuchi@u.washington.edu