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APS » Journals » Phys. Rev. B » Volume 78 » Issue 16
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Phys. Rev. B 78, 165424 (2008) [5 pages]

Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffraction

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S. M. O’Malley*, P. L. Bonanno, K. H. Ahn, and A. A. Sirenko
Department of Physics, New Jersey Institute of Technology, Newark, New Jersey 07102, USA

A. Kazimirov
Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853, USA

M. Tanimura
Department of Research, NISSAN ARC, LTD., Yokosuka, Kanagawa 237-0061, Japan

T. Asada
Department of Research, NISSAN ARC, LTD., Yokosuka, Kanagawa 237-0061, Japan and Rutgers Center for Emergent Materials and Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA

S. Park, Y. Horibe, and S-W. Cheong
Rutgers Center for Emergent Materials and Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA

Received 15 April 2008; revised 19 August 2008; published 27 October 2008

The intriguing structural properties of a ZnMnGaO4 film epitaxially grown on MgO (001) substrate have been investigated using synchrotron-radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a self-assembled checkerboard (CB) structure with highly aligned and regularly spaced vertical nanorods. The lattice parameters of the orthorhombic and rotated tetragonal phases of the CB structure were analyzed by measuring H-K, H-L, and K-L cross-sectional reciprocal space maps. We demonstrate that symmetry of lattice distortions at the phase boundaries provides means for the coherent coexistence of two domain types within the film volume.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.78.165424
DOI:
10.1103/PhysRevB.78.165424
PACS:
81.16.Dn, 61.46.−w, 61.05.cp

*so26@njit.edu

 
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