Phys. Rev. B 78, 125330 (2008) [4 pages]Gated-charge force microscopy for imaging a surface-acoustic-wave-induced charge in a depleted one-dimensional channelSee Also: Publisher's Note Received 21 August 2008; published 30 September 2008; corrected 14 October 2008 Gated-charge force microscopy (GCFM) generates images of subsurface induced charge with single-electron charge resolution and zero sensitivity to background charge, for the noninvasive study of confined quantum electronic systems. By gating the radio-frequency signal applied to transducers, which generate surface-acoustic waves (SAWs), we use GCFM to generate images of a GaAs depleted one-dimensional channel and provide insight to SAW-induced transport. Unexpected SAW-induced subsurface charge was imaged at points of high potential gradient. This suggests that electrons depopulating a SAW minimum due to a high potential gradient rapidly lose energy and interact with following SAW minima. © 2008 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.78.125330
DOI:
10.1103/PhysRevB.78.125330
PACS:
73.23.−b, 85.50.−n, 07.79.−v
See AlsoPublisher's Note: R. Crook, R. J. Schneble, M. Kataoka, H. E. Beere, D. A. Ritchie, D. Anderson, G. A. C. Jones, C. G. Smith, C. J. B. Ford, and C. H. W. Barnes, Publisher's Note: Gated-charge force microscopy for imaging a surface-acoustic-wave-induced charge in a depleted one-dimensional channel [Phys. Rev. B 78, 125330 (2008)], Phys. Rev. B 78, 159903 (2008). |
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