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Phys. Rev. B 78, 104104 (2008) [11 pages]

Fast molecular-dynamics simulation for ferroelectric thin-film capacitors using a first-principles effective Hamiltonian

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Takeshi Nishimatsu1,2, Umesh V. Waghmare3, Yoshiyuki Kawazoe2, and David Vanderbilt1
1Department of Physics and Astronomy, Rutgers University, 136 Frelinghuysen Road, Piscataway, New Jersey 08544-8019, USA
2Institute for Materials Research (IMR), Tohoku University, Sendai 980-8577, Japan
3Theoretical Sciences Unit, Jawaharlal Nehru Centre for Advanced Scientific Research (JNCASR), Jakkur, Bangalore, 560 064, India

Received 14 April 2008; revised 13 June 2008; published 4 September 2008

A newly developed fast molecular dynamics method is applied to BaTiO3 ferroelectric thin-film capacitors with short-circuited electrodes or under applied voltage. The molecular dynamics simulations based on a first-principles effective Hamiltonian clarify that dead layers (or passive layers) between ferroelectrics and electrodes markedly affect the properties of capacitors, and predict that the system is unable to hop between a uniformly polarized ferroelectric structure and a striped ferroelectric domain structure at low temperatures. Simulations of hysteresis loops of thin-film capacitors are also performed, and their dependence on film thickness, epitaxial constraints, and electrodes are discussed.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.78.104104
DOI:
10.1103/PhysRevB.78.104104
PACS:
77.80.Dj, 77.80.Fm, 64.70.Nd