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Phys. Rev. B 77, 094130 (2008) [12 pages]

Primary 29Si hyperfine structure of E centers in nm-sized silica: Probing the microscopic network structure

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A. Stesmans, K. Clémer, and V. V. Afanas’ev
Semiconductor Physics Laboratory, Department of Physics, and INPAC-Institute for Nanoscale Physics and Chemistry, University of Leuven, Belgium

Received 14 March 2007; revised 28 December 2007; published 25 March 2008

Point defects in fumed ∼7-nm-sized fumed silica nanoparticles have been studied by X-, K-, and Q-band electron spin resonance (ESR) following 10-eV irradiation. The E defects are monitored as a function of post manufacture heat treatment with the sample brought into contact with “bulk” Si∕SiO2 entities at elevated temperatures in vacuum (Tan=1005–1205 °C), i.e., the presence of an Si∕SiO2 interface. This results in a drastic increase in E defect density with increasing Tan, enabling us to resolve the primary 29Si hyperfine (hf) structure of the E centers located in the core region of the nanoparticles. Detailed analysis of the observed hf spectra reveals several items pointing to a modification of the specific network structure of the core region of the nanoparticles. An increased hf splitting of 438±2 G is observed compared to bulk silica (418±2 G) indicating that the core part E centers exhibit a more pyramidal defect structure. Moreover, the increased primary hf splitting indicates that the core of the fumed silica particles is densified, possibly associated with the presence of more low-membered rings in the nm-sized silica network.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.77.094130
DOI:
10.1103/PhysRevB.77.094130
PACS:
61.46.Df, 61.72.J−, 68.35.Dv, 76.30.Mi