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Phys. Rev. B 77, 165202 (2008) [6 pages]

Exciton spectroscopy of hexagonal boron nitride using nonresonant x-ray Raman scattering

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Yejun Feng1,*, J. A. Soininen2, A. L. Ankudinov3, J. O. Cross1, G. T. Seidler3,†, A. T. Macrander1, J. J. Rehr3, and E. L. Shirley4
1Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
2Department of Physical Science, University of Helsinki, Helsinki FIN-00014, Finland
3Department of Physics, University of Washington, Seattle, Washington 98195, USA
4Optical Technology Division, NIST, Gaithersburg, Maryland 20899, USA

Received 3 October 2007; revised 5 February 2008; published 8 April 2008

We report nonresonant x-ray Raman scattering (XRS) measurements on the boron K edge of hexagonal boron nitride for transferred momentum (q) from 2 to 9 Å−1 along directions both in and out of the basal plane. A symmetry-based argument, together with real-space full multiple scattering calculations of the projected density of states in the spherical harmonics basis, reveals that a strong pre-edge feature is a dominantly Y10-type exciton with no other s, p, or d components. This conclusion is supported by a second, independent calculation of the q-dependent XRS cross section based on the Bethe-Salpeter equation. This study demonstrates methods which should be applicable to the determination of final-state symmetries for localized resonances in other q-dependent XRS studies of anisotropic single-crystal systems.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.77.165202
DOI:
10.1103/PhysRevB.77.165202
PACS:
71.35.−y, 61.05.cj

*yejun@aps.anl.gov

seidler@phys.washington.edu