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Phys. Rev. B 77, 115405 (2008) [6 pages]

Time-varying tip-sample force measurements and steady-state dynamics in tapping-mode atomic force microscopy

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Ozgur Sahin*
The Rowland Institute at Harvard, Harvard University, Cambridge, Massachusetts 02142, USA

Received 28 October 2007; published 5 March 2008

Direct time-varying tip-sample force measurements by torsional harmonic cantilevers facilitate detailed investigations of the cantilever dynamics in tapping-mode atomic force microscopy. Here, we report experimental evidence that the mathematical relationships describing the steady-state dynamics are quantitatively satisfied by the independent measurements of tip-sample forces over a broad range of experimental conditions. These results confirm the existing understanding of tapping-mode atomic force microscopy and build confidence on the reliability of time-varying tip-sample force measurements by the torsional harmonic cantilevers.

© 2008 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.77.115405
DOI:
10.1103/PhysRevB.77.115405
PACS:
68.37.Ps, 07.79.Lh

*sahin@rowland.harvard.edu