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Phys. Rev. B 76, 075337 (2007) [7 pages]

Ballistic-phonon heat conduction at the nanoscale as revealed by time-resolved x-ray diffraction and time-domain thermoreflectance

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M. Highland, B. C. Gundrum, Yee Kan Koh, R. S. Averback, and David G. Cahill
Frederick Seitz Materials Research Laboratory and Department of Materials Science and Engineering, University of Illinois, Urbana, Illinois 61801, USA

V. C. Elarde and J. J. Coleman
Department of Electrical and Computer Engineering, University of Illinois, Urbana, Illinois 61801, USA

D. A. Walko and E. C. Landahl
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

Received 1 June 2007; revised 16 July 2007; published 22 August 2007

We use time-resolved measurements of the evolution of surface and buried layer temperatures to quantify the contribution of ballistic phonons to heat transport on nanometer length scales. A laser pulse heats a 100 nm thick Al film which cools by conduction into a GaAs substrate. The top 120–250 nm of the GaAs substrate is doped with In to create a buried layer with a distinct lattice constant. The cooling of the Al film is monitored by time-domain thermoreflectance and, in the second set of experiments, the heating and cooling of the GaAs:In buried layer are monitored by time-resolved x-ray diffraction. The combination of these data shows that thermal transport by ballistic phonons accounts for nearly 20% of the heat flow across the buried layer on nanosecond time scales.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.76.075337
DOI:
10.1103/PhysRevB.76.075337
PACS:
66.70.+f, 65.40.−b