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Phys. Rev. B 76, 144425 (2007) [5 pages]

X-ray resonant magnetic scattering study of magnetization reversals in a nanoscale spin-valve array

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Dong Ryeol Lee1,*, John W. Freeland2, Yongseong Choi3, George Srajer2, Vitali Metlushko4, and Bojan Ilic5
1Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang 790-784, Korea
2Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
3Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
4Department of Electrical and Computer Engineering, University of Illinois at Chicago, Chicago, Illinois 60607, USA
5Cornell Nanofabrication Facility, Cornell University, Ithaca, New York 14853, USA

Received 9 February 2007; revised 15 May 2007; published 19 October 2007

We present an x-ray resonant magnetic scattering study that uses the periodicity of a patterned array of trilayer (Co∕Cu∕NiFe) elements to determine not only layer-dependent magnetic hysteresis, but, more importantly, to extract the magnetization reversal in different sections of the picture-frame-shaped structure. Spatially resolved and layer-resolved magnetization measurements have revealed that magnetic switching mechanism is very distinct in different regions of the structure and results from a balancing of the shape anisotropy and strong interlayer dipolar coupling. These results demonstrate how spatially averaged measurements are not sufficient to resolve the nature of the reversal mechanism within the structure.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.76.144425
DOI:
10.1103/PhysRevB.76.144425
PACS:
75.60.Jk, 75.75.+a, 61.10.−i

*drlee@postech.ac.kr