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Phys. Rev. B 76, 115423 (2007) [10 pages]

Scanning tunneling microscopy fingerprints of point defects in graphene: A theoretical prediction

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H. Amara1,2, S. Latil1, V. Meunier3, Ph. Lambin1, and J.-C. Charlier2
1Laboratoire de Physique du Solide, Facultés Universitaires Notre-Dame de la Paix, Rue de Bruxelles 61, 5000 Namur, Belgium
2PCPM and CERMIN, Université Catholique de Louvain, Place Croix du Sud 1, 1348 Louvain-la Neuve, Belgium
3Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

Received 19 April 2007; revised 12 July 2007; published 18 September 2007

Scanning tunneling microscopy (STM) is one of the most appropriate techniques to investigate the atomic structure of carbon nanomaterials. However, the experimental identification of topological and nontopological modifications of the hexagonal network of sp2 carbon nanostructures remains a great challenge. The goal of the present theoretical work is to predict the typical electronic features of a few defects that are likely to occur in sp2 carbon nanostructures, such as atomic vacancy, divacancy, adatom, and Stone-Wales defect. The modifications induced by those defects in the electronic properties of the graphene sheet are investigated using first-principles calculations. In addition, computed constant-current STM images of these defects are calculated within a tight-binding approach in order to facilitate the interpretation of STM images of defected carbon nanostructures.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.76.115423
DOI:
10.1103/PhysRevB.76.115423
PACS:
61.46.−w, 63.20.Kr, 73.20.−r, 73.43.Jn