Phys. Rev. B 76, 104430 (2007) [8 pages]Influence of spacer layer morphology on the exchange-bias properties of reactively sputtered Co∕Ag multilayersReceived 5 December 2006; revised 16 July 2007; published 25 September 2007 We have studied the magnetic properties of [Ag(tAg)∕Co(1.2 nm)]60 multilayers grown in an oxygen atmosphere. Partial oxidation of the Co layers results in the appearance of tAg dependent exchange-bias properties. A strong increase in the exchange-bias field HE together with a significant reduction in the coercivity HC are observed when tAg is decreased below tAg*=4 nm, whereas these two parameters adopt approximately constant values for tAg>tAg*. At tAg*, a transition from continuous to islandlike silver layers (on reducing tAg) is signaled by electrical resistivity and x-ray reflectivity results. From magnetic hysteresis loops recorded at room temperature and magnetization curves, it is concluded that this transition induces a granular morphology in the Co regions, which are previously (tAg>tAg*) plateletlike, and enhances the oxidized fraction of Co (fCoO). The increase (decrease) in HE (HC) with reducing tAg below tAg* is correlated to the increase in both the electrical resistivity and fCoO. From the latter correlation, we infer that the higher degree of oxidation in the granular Co layers is associated with effectively thicker antiferromagnetic (CoO) regions than in the tAg>tAg* (continuous multilayer) case—with correspondingly higher magnetic anisotropy energies—which may account for both the enhancement in HE and the reduction in HC. In addition, our study provides information on the surfactant effect of O2 in Ag sputter growth since the continuity thickness value (tAg*=4 nm) is found to be lower than those previously reported in nonreactive sputtering of Ag. © 2007 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.76.104430
DOI:
10.1103/PhysRevB.76.104430
PACS:
75.75.+a, 75.30.Gw, 82.70.Uv
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