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Phys. Rev. B 75, 184521 (2007) [6 pages]

Scanning tunneling spectroscopy characterization of the pseudogap and the x=1/8 anomaly in La2−xSrxCuO4 thin films

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Ofer Yuli, Itay Asulin, and Oded Millo*
Racah Institute of Physics, The Hebrew University of Jerusalem, Jerusalem 91904, Israel

Gad Koren
Department of Physics, Technion—Israel Institute of Technology, Haifa 32000, Israel

Received 31 October 2006; revised 11 January 2007; published 22 May 2007

Using scanning tunneling spectroscopy we examined the local density of states of thin c-axis La2−xSrxCuO4 films, over wide doping and temperature ranges. We found that the pseudogap exists only at doping levels lower than optimal. For x=0.12, close to the “anomalous” x=1/8 doping level, a zero-bias conductance peak was the dominant spectral feature, instead of the excepted V-shaped (c-axis tunneling) gap structure. We have established that this surprising effect cannot be explained by tunneling into (110) facets. Possible origins for this unique behavior are discussed.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.75.184521
DOI:
10.1103/PhysRevB.75.184521
PACS:
74.72.Dn, 74.50.+r, 74.78.Bz, 74.25.Jb

*Electronic address: milode@vms.huji.ac.il