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Phys. Rev. B 75, 115305 (2007) [8 pages]

Exciton impact-ionization dynamics modulated by surface acoustic waves in GaN

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J. Pedrós*
Instituto de Sistemas Optoelectrónicos y Microtecnología and Departamento de Ingeniería Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, Ciudad Universitaria, 28040 Madrid, Spain

Y. Takagaki, T. Ive, M. Ramsteiner, O. Brandt, U. Jahn, and K. H. Ploog
Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, 10117 Berlin, Germany

F. Calle
Instituto de Sistemas Optoelectrónicos y Microtecnología and Departamento de Ingeniería Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, Ciudad Universitaria, 28040 Madrid, Spain

Received 27 July 2006; revised 15 November 2006; published 8 March 2007

The quenching of the photoluminescence induced by the fundamental and guided high-order Rayleigh-type modes propagating in the GaN∕6H-SiC(0001) heterostructure is compared. Two material types have been considered: conventional GaN and GaN underneath the Ga droplets formed during the molecular-beam-epitaxy growth. The different piezoelectric field-depth profile of each surface acoustic wave (SAW) is used to analyze their characteristics. A coupled-rate-equations model based on the impact ionization of the free and donor-bound excitons under the SAW-generated piezoelectric fields is presented, which satisfactorily reproduces the experimental results. The exciton impact-ionization rate reveals two regimes when the SAW power is increased, each of which seems to be plausibly dominated by the hole- and electron-initiated impact ionization. The SAW-induced impact-ionization model is also indicated to be valid for other wide direct band-gap piezoelectric semiconductors, such as CdS, ZnO, and AlN, where the field ionization requires an even larger electric field than in GaN.

© 2007 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.75.115305
DOI:
10.1103/PhysRevB.75.115305
PACS:
78.20.Hp, 77.65.Dq, 71.35.Cc, 78.55.Cr

*Email address: jpedros@die.upm.es