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Phys. Rev. B 74, 075103 (2006) [5 pages]

Far-field subdiffraction optical microscopy using metamaterial crystals: Theory and simulations

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Alessandro Salandrino and Nader Engheta*
Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA

Received 26 May 2006; published 15 August 2006

Here we suggest and explore theoretically an idea for a far-field scanless optical microscopy with a subdiffraction resolution. We exploit the special dispersion characteristics of an anisotropic metamaterial crystal that is obliquely cut at its output plane, or has a curved output surface, in order to map the input field distribution onto the crystal’s output surface with a compressed angular spectrum, resulting in a “magnified” image. This can provide a far-field imaging system with a resolution beyond the diffraction limits while no scanning is needed.

© 2006 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.74.075103
DOI:
10.1103/PhysRevB.74.075103
PACS:
78.67.Pt, 07.60.Pb, 42.79.−e, 78.20.−e

*To whom correspondence should be addressed. Email address: engheta@ee.upenn.edu