Phys. Rev. B 72, 085443 (2005) [6 pages]Influence of grain-boundary defects on electric transport in CeRhSn with a non-Fermi-liquid ground stateSee Also: Publisher's Note Received 11 February 2005; revised 25 April 2005; published 18 August 2005; corrected 22 August 2005 Measurements by atomic force microscopy reported for a polycrystalline CeRhSn sample show nanometer-sized grains consisting of crystalline components. The grains are separated by a grain boundary. The high-resolution electron microscopy and secondary-ion mass spectrometry were used to determine homogeneity of the grains and the grain boundary. The grains are homogeneous up to about 60% of the major phase, with slightly off-stoichiometric phases constituting the balance, whereas the volume fractions of intercrystalline components are strongly inhomogeneous and off stoichiometric. We argue that there is possibly a ballistic transport of electrons through an interface between the grains, which strongly modifies the resistivity of the CeRhSn stoichiometric grains, which is non-Fermi-liquid in character. © 2005 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.72.085443
DOI:
10.1103/PhysRevB.72.085443
PACS:
61.10.Nz, 71.27.+a, 61.72.Ff, 66.30.Qa
See AlsoPublisher's Note: A. Ślebarski, K. Szot, M. Gamża, H. J. Penkalla, and U. Breuer, Publisher's Note: Influence of grain-boundary defects on electric transport in CeRhSn with a non-Fermi-liquid ground state [Phys. Rev. B 72, 085443 (2005)], Phys. Rev. B 72, 129903 (2005). |
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