Phys. Rev. B 72, 035104 (2005) [5 pages]X-ray Raman scattering at the L edges of elemental Na, Si, and the N edge of Ba in Ba8Si46Received 19 January 2005; revised 15 March 2005; published 5 July 2005 X-ray Raman spectra of the Na and Si LII,III edges have been measured for different momentum transfers at beamline ID16 of European Synchrotron Radiation Facility using the inelastic x-ray-scattering setup with an energy resolution of about 1 eV. The momentum transfer dependence of these spectra is analyzed using a first-principles method that takes into account the particle-hole interaction as well as the final states self-energy effects. As an example for application of x-ray Raman scattering to higher Z elements the Ba N edge of a sample of Ba-doped Si clathrate Ba8Si46 is presented. The potential of x-ray Raman scattering to measure L, M, and N edges is emphasized and discussed along with the future perspectives of different theoretical approaches. © 2005 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.72.035104
DOI:
10.1103/PhysRevB.72.035104
PACS:
78.70.Ck, 71.15.−m, 71.20.−b, 71.45.Gm
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