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Phys. Rev. B 72, 172101 (2005) [3 pages]

Coercive field dependence of the grain size of ferroelectric films

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J. S. Liu*, S. R. Zhang, H. Z. Zeng, C. T. Yang, and Y. Yuan
School of Microelectronics and Solid State Electronics, University of Electronic Science and Technology of China, Chengdu, 610054, People’s Republic of China

Received 3 June 2005; published 1 November 2005

The coercive field (Ec) of Pb(Zr0.55Ti0.45)O3 film was experimentally observed showing a paraboliclike relationship with grain size d. The curvature of Ecd increased as the film thickness decreased. A phenomenological theory was developed to describe the experimental results, taking into account the contributions of domain wall motion and domain structure transition to the polarization switching. The simulated results agreed with the experimental results very well. In addition to the paraboliclike Ecd curve, it was also found that the influence of thickness on the curvature was attributed to the dielectric dependence on the film thickness.

© 2005 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.72.172101
DOI:
10.1103/PhysRevB.72.172101
PACS:
77.80.−e

*Electronic address: jason@uestc.edu.cn