Phys. Rev. B 71, 052504 (2005) [3 pages]T linearity of in-plane resistivity in Bi2Sr2CaCu2O8+δ thin filmsReceived 25 September 2004; revised 6 December 2004; published 22 February 2005 We performed a temperature and doping-dependent study of in-plane dc resistivity (IDCR) on molecular beam epitaxy grown Bi2Sr2CaCu2O8+δ thin films. By analyzing the temperature dependence of normal state IDCR as a function of doping level, we show that long-known T-linear dependence of normal state IDCR occurs not at the optimal doping (p=0.16∕Cu) but at an overdoping of p=0.19∕Cu, which coincides with the recently proposed putative quantum critical point. This observation suggests that p=0.19 may be a sample-independent critical doping level at least for bilayer cuprate systems. © 2005 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.71.052504
DOI:
10.1103/PhysRevB.71.052504
PACS:
74.62.Dh, 74.25.Fy, 74.78.Bz, 74.72.Hs
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