Phys. Rev. B 71, 045424 (2005) [6 pages]Electronic dephasing in wires due to metallic gatesReceived 15 June 2004; revised 22 September 2004; published 25 January 2005 The dephasing effect of metallic gates on electrons moving in one quasi-one-dimensional diffusive wire is analyzed. The incomplete screening in this geometry implies that the effect of the gate can be described, at high energies or temperatures, as an electric field fluctuating in time. The resulting system can be considered a realization of the Caldeira-Leggett model of an environment coupled to many particles. Within the range of temperatures where this approximation is valid, a simple estimation of the inverse dephasing time gives τG−1∝T1∕2. © 2005 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.71.045424
DOI:
10.1103/PhysRevB.71.045424
PACS:
73.21.−b, 73.23.−b
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