Phys. Rev. B 71, 113313 (2005) [4 pages]Optical nonlinearity in silicon nanoparticles: Effect of size and probing intensityReceived 2 September 2004; revised 9 November 2004; published 31 March 2005 Self-phase modulated optical fringe patterns are used to study the nonlinear optical response of nanocrystalline silicon produced by laser-induced etching. Intensity-dependent changes in the refractive index are calculated for various sizes of nanocrystallites. Raman spectroscopy is used to determine the sizes of nanocrystals, which are also confirmed from atomic force microscopic images. These results are in agreement with self-phase modulation model. It invokes the change in refractive index of nanoparticles of silicon with decrease of size of nanoparticles. © 2005 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.71.113313
DOI:
10.1103/PhysRevB.71.113313
PACS:
78.20.−e, 78.30.Am, 63.22.+m
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