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Phys. Rev. B 70, 081306(R) (2004) [4 pages]

Optical-fiber-based measurement of an ultrasmall volume high-Q photonic crystal microcavity

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Kartik Srinivasan*, Paul E. Barclay, Matthew Borselli, and Oskar Painter
Department of Applied Physics, California Institute of Technology, Pasadena, California 91125, USA

Received 25 September 2003; revised 21 June 2004; published 25 August 2004

A two-dimensional photonic crystal semiconductor microcavity with a quality factor Q∼40,000 and a modal volume Veff∼0.9 cubic wavelengths is demonstrated. A micron-scale optical fiber taper is used as a means to probe both the spectral and spatial properties of the cavity modes, allowing not only measurement of modal loss, but also the ability to ascertain the in-plane localization of the cavity modes. This simultaneous demonstration of high-Q and ultrasmall Veff in an optical microcavity is of potential interest in nonlinear optics, optoelectronics, and quantum optics, where the measured Q and Veff values could enable strong coupling to both atomic and quantum dot systems.

© 2004 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.70.081306
DOI:
10.1103/PhysRevB.70.081306
PACS:
42.60.Da, 42.50.Pq, 42.70.Qs

*Electronic address: kartik@caltech.edu