Phys. Rev. B 70, 224206 (2004) [7 pages]Anomalous layering at the liquid Sn surfaceSee Also: Erratum Received 29 June 2004; revised 1 October 2004; published 15 December 2004 X-ray reflectivity measurements on the free surface of liquid Sn are presented. They exhibit the high-angle peak, indicative of surface-induced layering, also found for other pure liquid metals (Hg, Ga, and In). However, a low-angle shoulder, not hitherto observed for any pure liquid metal, is also found, indicating the presence of a high-density surface layer. Fluorescence and resonant reflectivity measurements rule out the assignment of this layer to surface segregation of impurities. The reflectivity is modeled well by a 10% contraction of the spacing between the first and second atomic surface layers, relative to that of subsequent layers. Possible reasons for this are discussed. © 2004 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.70.224206
DOI:
10.1103/PhysRevB.70.224206
PACS:
61.10.−i, 61.25.Mv, 68.03.Hj
See AlsoErratum: Oleg G. Shpyrko, Alexei Yu. Grigoriev, Christoph Steimer, Peter S. Pershan, Binhua Lin, Mati Meron, Tim Graber, Jeff Gerbhardt, Ben Ocko, and Moshe Deutsch, Erratum: Anomalous layering at the liquid Sn surface [Phys. Rev. B 70, 224206 (2004)], Phys. Rev. B 73, 019901 (2006). |
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