Phys. Rev. B 70, 220507(R) (2004) [4 pages]Strong dependence of the interlayer coupling on the hole mobility in antiferromagnetic La2−xSrxCuO4 (x<0.02)
We have studied the magnetic coupling between the CuO2 planes in the antiferromagnetic (AF) phase of Sr- and Zn-doped La2CuO4 by analyzing the spin-flip transition in the magnetization curves. We find that the interlayer coupling plays a key role in the suppression of the AF phase, and that only mobile holes cause a strong frustration of the interlayer coupling. Depending on the hole mobility, samples with identical Néel temperature can have a very different interlayer coupling. © 2004 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.70.220507
DOI:
10.1103/PhysRevB.70.220507
PACS:
74.25.Ha, 74.72.Dn, 75.30.Hx, 75.40.Cx
See AlsoComment: I. Ya. Korenblit, A. Aharony, and O. Entin-Wohlman, Comment on “Strong dependence of the interlayer coupling on the hole mobility in antiferromagnetic La2−xSrxCuO4 (x<0.02)”, Phys. Rev. B 73, 106501 (2006). |
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