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Phys. Rev. B 68, 224409 (2003) [19 pages]

X-ray resonant magnetic scattering from structurally and magnetically rough interfaces in multilayered systems. I. Specular reflectivity

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D. R. Lee*
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

S. K. Sinha
Department of Physics, University of California, San Diego, La Jolla, California 92093, USA
Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA

D. Haskel, Y. Choi, J. C. Lang, S. A. Stepanov, and G. Srajer
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

Received 9 May 2003; published 10 December 2003

The theoretical formulation of x-ray resonant magnetic scattering from rough surfaces and interfaces is given for specular reflectivity. A general expression is derived for both structurally and magnetically rough interfaces in the distorted-wave Born approximation as the framework of the theory. For this purpose, we have defined a “structural” and a “magnetic” interface to represent the actual interfaces. A generalization of the well-known Nevot-Croce formula for specular reflectivity is obtained for the case of a single rough magnetic interface using the self-consistent method. Finally, the results are generalized to the case of multiple interfaces, as in the case of thin films or multilayers. Theoretical calculations for each of the cases are illustrated with numerical examples and compared with experimental results of magnetic reflectivity from a Gd/Fe multilayer.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.68.224409
DOI:
10.1103/PhysRevB.68.224409
PACS:
75.70.Cn, 61.10.Kw

*Electronic address: drlee@aps.anl.gov

Also at Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208.