corner
corner

Phys. Rev. B 68, 125305 (2003) [5 pages]

Characterization of GaN quantum discs embedded in AlxGa1-xN nanocolumns grown by molecular beam epitaxy

Download: PDF (417 kB) Buy this article Export: BibTeX or EndNote (RIS)

J. Ristić*, E. Calleja, M. A. Sánchez-García, and J. M. Ulloa
ISOM and Departamento Ingeniería Electrónica, ETSI Telecomunicación, Universidad Politécnica de Madrid, 28040 Madrid, Spain

J. Sánchez-Páramo and J. M. Calleja
Departamento Física de Materiales, Universidad Autónoma de Madrid, Cantoblanco, 28049 Madrid, Spain

U. Jahn, A. Trampert, and K. H. Ploog
Paul-Drude-Institut für Festkörperelektronik, 10117 Berlin, Germany

Received 5 December 2002; revised 19 May 2003; published 8 September 2003

GaN quantum discs embedded in AlGaN nanocolumns with outstanding crystal quality and very high luminescence efficiency were grown on Si(111) substrates by plasma-assisted molecular beam epitaxy under highly N-rich conditions. Nanocolumns with diameters in the range of 30–150 nm, with no traces of any extended defects, as confirmed by transmission electron microscopy, were obtained. GaN quantum discs, 2 and 4 nm thick, were grown embedded in AlGaN nanocolumns by switching on and off the Al flux during variable time spans. Strong optical emissions from GaN quantum discs, observed by photoluminescence and cathodoluminescence measurements, reveal quantum confinement effects. While Raman data indicate that the nanocolumns are fully relaxed, the quantum discs appear to be fully strained. These nanostructures have a high potential for application in efficient vertical cavity emitters.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.68.125305
DOI:
10.1103/PhysRevB.68.125305
PACS:
68.65.Hb, 81.15.Hi, 78.55.Cr

*Electronic address: jelena@die.upm.es