corner
corner

Phys. Rev. B 67, 092202 (2003) [4 pages]

Anelastic compression of nanometer-sized silica particles under high pressure: A high-energy x-ray diffraction measurement

Download: PDF (46 kB) Buy this article Export: BibTeX or EndNote (RIS)

T. Uchino1,2,*, A. Sakoh3, M. Azuma2,3, S. Kohara4, M. Takahashi3, M. Takano3, and T. Yoko3
1Department of Chemistry, Kobe University, Nada-ku, Kobe 657-8501, Japan
2PRESTO, Japan Science and Technology Corporation, Kawaguchi, Saitama 332-0012, Japan
3Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011, Japan
4SPring-8, Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198, Japan

Received 5 September 2002; revised 9 December 2002; published 13 March 2003

We compressed nanometer-sized silica particles, fumed silica, using a cubic-anvil-type apparatus up to pressures of 8 GPa at room temperature. The high-energy (61.7 keV) x-ray diffraction measurements of the recovered samples were carried out to determine the x-ray structure factor and in the real space correlation functions. These results indicate that anelastic compression occurs in silica nanoparticles in the pressure range from 4 to 8 GPa, which is well below the pressure regime of the anelastic compression (∼10 to ∼20 GPa) observed for bulk amorphous silica.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.67.092202
DOI:
10.1103/PhysRevB.67.092202
PACS:
61.43.-j, 61.10.-i

*Electronic address: uchino@kobe-u.ac.jp