Phys. Rev. B 67, 052401 (2003) [4 pages]Buried antiferromagnetic films investigated by x-ray magneto-optical reflection spectroscopyReceived 7 November 2002; published 5 February 2003 It is shown that the spin-polarized electronic structure of antiferromagnetic (AFM) materials can be investigated on an element-selective level using a versatile, novel x-ray magneto-optical spectroscopy in reflection. We demonstrate this with spectra observed at the Ni L3 absorption edge of two buried exchange-biased microstructures of current technological interest: NiO/Co and NiMn/Co, which contain the insulating antiferromagnet NiO, and the metallic antiferromagnet NiMn, respectively. The measured spectrum provides information about the exchange-split d density of states of the AFM atom. © 2003 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.67.052401
DOI:
10.1103/PhysRevB.67.052401
PACS:
75.70.-i, 78.20.Ls
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