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Phys. Rev. B 67, 224501 (2003) [7 pages]

Temperature and power dependence of Shapiro and Fiske step widths in Nb/InAs/Nb Josephson junctions

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Peter Baars*, Andreas Richter, and Ulrich Merkt
Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Universität Hamburg, Jungiusstr. 11, D-20355 Hamburg, Germany

Received 9 July 2002; revised 15 January 2003; published 3 June 2003

We present experimental investigations on the ac Josephson effect in Nb/InAs/Nb Josephson junctions. We find oscillatory behavior of both Shapiro and Fiske step widths as a function of irradiated power and, furthermore, oscillations of Shapiro step widths with temperature. The measured temperature and power dependencies of Shapiro and Fiske step widths are well described by adapted resistively and capacitively shunted junction models accounting for excess currents and a nonuniform current distribution, respectively.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.67.224501
DOI:
10.1103/PhysRevB.67.224501
PACS:
74.50.+r, 73.23.-b, 74.45.+c

*Electronic address: baars@physnet.uni-hamburg.de