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Phys. Rev. B 66, 161316(R) (2002) [4 pages]

Adsorbed Si on the Si(111)-(7×7) surface studied by scanning tunneling microscopic and molecular-orbital approaches: Stationary and diffusing Si adsorbates

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Hironaga Uchida1,*, Satoshi Watanabe2, Hiromi Kuramochi3, Jooyoung Kim1, Kazuhiro Nishimura1, Mitsuteru Inoue1, and Masakazu Aono3
1Department of Electric and Electronic Engineering, Toyohashi University of Technology, Tempaku, Toyohashi, Aichi 441-8580, Japan
2Department of Materials Science, The University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-8656, Japan
3Department of Precision Science and Technology, Osaka University, Yamada-oka, Suita, Osaka 565-0871, Japan

Received 19 August 2002; published 29 October 2002

In experiments of Si deposition onto the Si(111)7×7 surface using scanning tunneling microscopy, we observe “diffusing” Si adsorbates detected as a noise-shaped pattern in addition to the previously reported “stationary” ones that remain at the same positions. The stable positions and diffusion energy barriers of Si atoms on the surface are obtained using molecular-orbital calculations. For one Si atom, the diffusion barrier is only several tenths of eV, while it exceeds 1 eV for two Si atoms. We propose some assignments: the “stationary” adsorbate for the two Si atoms and “diffusing” one for the single Si atom.

© 2002 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.66.161316
DOI:
10.1103/PhysRevB.66.161316
PACS:
68.43.Fg, 68.37.Ef, 68.43.Jk

*Corresponding author. Email address: uchida@eee.tut.ac.jp