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Phys. Rev. B 66, 104525 (2002) [5 pages]

I-V characteristic measurements to study the nature of the vortex state and dissipation in MgB2 thin films

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S. K. Gupta*, Shashwati Sen, Ajay Singh, D. K. Aswal, and J. V. Yakhmi
Technical Physics & Prototype Engineering Division, Bhabha Atomic Research Center, Mumbai 400 085, India

Eun-Mi Choi, Hyun-Jung Kim, Kijoon H. P. Kim, Seungje Choi, Hyun-Sook Lee, W. N. Kang, and Sung-Ik Lee
National Creative Research Initiative Center for Superconductivity, Department of Physics, Pohang University of Science and Technology, Pohang 790-784, Republic of Korea

Received 26 April 2002; published 30 September 2002

The temperature dependence of current-voltage (I-V) characteristics of MgB2 thin films has been studied at different magnetic fields (H) and angles (θ) between H and the ab plane. The I-V characteristics obtained at different H and θ show critical scaling indicative of vortex glass transition. The critical exponents are found to be independent of H and θ indicating a universal behavior. The scaling functions are also seen to be field and angle independent when resistivity and current density are normalized with two parameters ρ0 and J0, which are functions of H and θ. Field and angle dependences of parameters ρ0 and J0, and vortex glass transition temperature Tg are seen to be in agreement with the anisotropic Ginzburg-Landau model.

© 2002 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.66.104525
DOI:
10.1103/PhysRevB.66.104525
PACS:
74.60.Ge, 74.76.-w, 74.70.Ad

*Email address: drgupta@magnum.barc.ernet.in