Phys. Rev. B 61, 5707–5713 (2000)Medium-energy ion scattering studies of two-dimensional rare-earth silicidesReceived 21 September 1999; published in the issue dated 15 February 2000 Medium-energy ion scattering (MEIS) has been used to determine the atomic structure of two-dimensional (2D) rare-earth silicides on Si(111). In the case of the Si(111)1×1-Er 2D silicide surface, the MEIS results refine previously published results, but in the case of the Si(111)1×1-Ho surface, this work represents to our knowledge the first full quantitative structural analysis that reveals a structure similar to that of the Si(111)1×1-Er surface and directly supports a model in which a rare-earth monolayer resides below a Si bilayer close to bulklike termination. © 2000 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.61.5707
DOI:
10.1103/PhysRevB.61.5707
PACS:
68.35.Bs, 61.18.Bn, 61.82.Fk
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