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Phys. Rev. B 61, 4884–4889 (2000)

Scanning tunneling microscopy of chromium-filled carbon nanotubes: Tip effects and related topographic features

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F.-X. Zha
Max-Planck-Institut für Festkörperforschung, D-70569 Stuttgart, Germany

R. Czerw and D. L. Carroll
Department of Physics and Astronomy, Clemson University, Clemson, South Carolina 29634

Ph. Kohler-Redlich and B.-Q. Wei
Max-Planck-Institut für Metallforschung, D-70174 Stuttgart, Germany

A. Loiseau
LEM, UMR no. 104 ONERA-CNRS, Boîte Postale 72, 92322 Châtillon Cedex, France

S. Roth
Max-Planck-Institut für Festkörperforschung, D-70569 Stuttgart, Germany

Received 16 August 1999; revised 26 October 1999; published in the issue dated 15 February 2000

We have used ultrahigh vacuum scanning tunneling microscopy (STM) to study chromium (Cr)-filled carbon nanotubes. STM micrographs show filled tubes to be less than 1 nm in height, while transmission electron microscopy indicates that Cr-filled naotubes are multiwalled with diameters generally over 10 nm. In this paper, we demonstrate that the small apparent heights are due to the STM tip status, which also accounts for the topographic anomalies observed.

© 2000 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.61.4884
DOI:
10.1103/PhysRevB.61.4884
PACS:
61.48.+c, 61.16.Ch, 68.35.Bs
 
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