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Phys. Rev. B 61, 11136–11138 (2000)

Second harmonic generation in hydrogenated amorphous silicon

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S. Alexandrova*, P. Danesh, and I. A. Maslyanitsyn
Institute of Solid State Physics, Bulgarian Academy of Sciences, Sofia - 1784, 72 Tzarigradsko Chaussee Boulevard, Bulgaria
General Physics Institute, Russian Academy of Sciences, Vavilov St. 38, Moscow 117942 GSP-1, Russia

Received 6 December 1999; published in the issue dated 15 April 2000

The first application of the second harmonic generation (SHG) technique to investigate the structure of a-Si:H films is reported. Dependence of SHG on the type of substrate material and the temperature during deposition has been observed. The origin of SHG is discussed. A stress model is proposed to explain the experimental results. It is suggested that the second harmonic is generated in a strained layer close to the substrate.

© 2000 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.61.11136
DOI:
10.1103/PhysRevB.61.11136
PACS:
81.05.Gc, 42.65.Ky, 71.55.Jv

*Electronic address: salex@issp.bas.bg