Phys. Rev. B 60, 16109–16113 (1999)GdFe2 alloy formation studied on the atomic scale by scanning tunneling microscopyReceived 12 May 1999; published in the issue dated 15 December 1999 Well-ordered GdFe2 alloy films of up to two ML thickness were grown on top of a W(110) substrate and characterized by using scanning tunneling microscopy/spectroscopy (STM/STS) and low-energy electron diffraction (LEED). The crystallographic structure of the ultrathin films was found to be different from the well-known bulk structure (C15 Laves phase). This is supposed to result from the influence of the substrate on the growth behavior. Based on atomically resolved STM images and LEED studies, a structure model for the ultrathin GdFe2 films on W(110) is proposed. © 1999 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.60.16109
DOI:
10.1103/PhysRevB.60.16109
PACS:
68.55.Jk, 71.70.Gm, 61.16.Ch
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