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Phys. Rev. B 58, R13419–R13422 (1998)

X-ray reflectivity study of temperature-dependent surface layering in liquid Hg

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E. DiMasi*
Department of Physics, Brookhaven National Laboratory, Upton, New York 11973-5000

H. Tostmann
Division of Engineering and Applied Sciences and Department of Physics, Harvard University, Cambridge, Massachusetts 02138

B. M. Ocko
Department of Physics, Brookhaven National Laboratory, Upton, New York 11973-5000

P. S. Pershan
Division of Engineering and Applied Sciences and Department of Physics, Harvard University, Cambridge, Massachusetts 02138

M. Deutsch
Department of Physics, Bar-Ilan University, Ramat-Gan 52100, Israel

Received 26 August 1998; published in the issue dated 15 November 1998

We report x-ray reflectivity measurements of liquid mercury between -36 °C and +25 °C. The surface structure can be described by a layered density profile convolved with a thermal roughness σT. The layering has a spacing of 2.72 Å and an exponential decay length of 5.0 Å. Surprisingly, σT is found to increase considerably faster with temperature than the √T behavior predicted by capillary wave theory, in contrast with previous measurements on Ga and dielectric liquids.

© 1998 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.58.R13419
DOI:
10.1103/PhysRevB.58.R13419
PACS:
61.25.Mv, 68.10.-m, 61.10.-i

*Author to whom correspondence should be addressed. Electronic address: dimasi@bnl.gov

 
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