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Phys. Rev. B 58, 7260–7268 (1998)

Self-consistent-charge density-functional tight-binding method for simulations of complex materials properties

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M. Elstner
Universität-GH, Paderborn, Fachbereich Physik, Theoretische Physik, D-33098 Paderborn, Germany
Department of Molecular Biophysics, German Cancer Research Center, D-69120 Heidelberg, Germany

D. Porezag, G. Jungnickel, J. Elsner, M. Haugk, and Th. Frauenheim
Universität-GH, Paderborn, Fachbereich Physik, Theoretische Physik, D-33098 Paderborn, Germany

S. Suhai
Department of Molecular Biophysics, German Cancer Research Center, D-69120 Heidelberg, Germany

G. Seifert
Technische Universität, Institut für Theoretische Physik, Mommsenstrasse 13, D-01062 Dresden, Germany

Received 9 September 1997; revised 19 March 1998; published in the issue dated 15 September 1998

We outline details about an extension of the tight-binding (TB) approach to improve total energies, forces, and transferability. The method is based on a second-order expansion of the Kohn-Sham total energy in density-functional theory (DFT) with respect to charge density fluctuations. The zeroth order approach is equivalent to a common standard non-self-consistent (TB) scheme, while at second order a transparent, parameter-free, and readily calculable expression for generalized Hamiltonian matrix elements may be derived. These are modified by a self-consistent redistribution of Mulliken charges (SCC). Besides the usual “band structure” and short-range repulsive terms the final approximate Kohn-Sham energy additionally includes a Coulomb interaction between charge fluctuations. At large distances this accounts for long-range electrostatic forces between two point charges and approximately includes self-interaction contributions of a given atom if the charges are located at one and the same atom. We apply the new SCC scheme to problems where deficiencies within the non-SCC standard TB approach become obvious. We thus considerably improve transferability.

© 1998 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.58.7260
DOI:
10.1103/PhysRevB.58.7260
PACS:
71.15.-m, 73.20.At