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Phys. Rev. B 58, 394–399 (1998)

Magnetism of thin Ising films with rough surfaces

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F. D. A. Aarão Reis
Instituto de Física, Universidade Federal Fluminense, Avenida Litorânea s/n, Campus da Praia Vermelha, 24210-340 Niterói RJ, Brazil

Received 18 August 1997; published in the issue dated 1 July 1998

We study the ferromagnetic Ising model on thin films of random thicknesses using Monte Carlo simulations. The films have a simple cubic lattice structure, length and width N, one flat surface and discretized Gaussian distributions of thicknesses with mean L and rms deviation ΔL. We consider the cases of ΔL=const for any L (type I) and ΔL/L=const for any L (type II). A decrease of the critical temperature Tc(L,ΔL) for fixed L and increasing roughness (ΔL) is observed. The specific-heat peak of rough films of finite length is reduced when compared to the uniform films. The susceptibility peak is not reduced for small roughness (ΔL<~1), and decreases for larger roughness. This type of disorder is shown to be irrelevant for the critical exponents, and two-dimensional finite-size scaling relations (in the lateral length N) do not have remarkable corrections when compared to the uniform films. In films of type I, the critical temperature shift tL=Tc(3D)-Tc(L,ΔL) scales with L approximately as in the uniform films, and a small roughness becomes irrelevant for L>10, where three-dimensional scaling is attained. In films of type II, tL decreases slowly with L, in disagreement with both two- and three-dimensional behavior for L<~10. We discuss the possible connections of our results and experiments in magnetic thin films.

© 1998 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.58.394
DOI:
10.1103/PhysRevB.58.394
PACS:
05.50.+q, 05.70.Jk, 64.60.Fr, 75.70.Ak