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Phys. Rev. B 57, 170–177 (1998)

Formation and annihilation of a bond defect in silicon: An ab initio quantum-mechanical characterization

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F. Cargnoni and C. Gatti
Centro CNR per lo Studio delle Relazioni fra Struttura e Reattività Chimica, via Golgi 19, I-20133 Milano, Italy

L. Colombo
Istituto Nazionale per la Fisica della Materia and Dipartimento di Scienza dei Materiali, Università degli Studi di Milano, via Emanueli 15, I-20126 Milano, Italy

Received 12 June 1997; published in the issue dated 1 January 1998

The electronic structure and bond properties of a lattice defect in silicon formed by the incomplete recombination of a vacancy-interstitial pair are described by combining tight-binding molecular-dynamics and ab initio Hartree-Fock calculations. The defect structure consists of a large nuclear distortion nearly perfectly compensated by electron charge rearrangment. The reaction path for its annihilation is reported and described in terms of an electron-density topological analysis within the quantum theory of atoms in molecules approach.

© 1998 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.57.170
DOI:
10.1103/PhysRevB.57.170
PACS:
61.72.Bb, 71.15.Fv, 82.20.Wt