Phys. Rev. B 56, 1529–1539 (1997)Multiple energy x-ray holography: Incident-radiation polarization effectsReceived 21 November 1996; revised 12 February 1997; published in the issue dated 15 July 1997 Multiple energy x-ray holography (MEXH) measures both phase and amplitude information for x rays scattered from an incident reference beam, from which three-dimensional atomic images can be directly reconstructed. The angular distribution of the x-ray scattering is highly dependent on the polarization direction via the Thomson scattering cross section. We consider here the effect of incident x-ray polarization on images of Fe atoms reconstructed from theoretical and experimental MEXH data for α-Fe2O3(001) (hematite). We also illustrate such polarization effects theoretically in the enhancement of specific atomic structural information of ideal Fe trimers, and a Ge δ-layer buried in Si(001), where the use of different polarization modes and experimental geometries is found to strongly influence atomic images. © 1997 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.56.1529
DOI:
10.1103/PhysRevB.56.1529
PACS:
61.10.-i, 61.14.-x
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