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Phys. Rev. B 54, 2917–2921 (1996)

Determination of the electronic density of states near buried interfaces: Application to Co/Cu multilayers

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A. Nilsson
Department of Physics, Box 530, Uppsala University, S-751 21 Uppsala, Sweden

J. Stöhr
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120

T. Wiell, M. Aldén, P. Bennich, and N. Wassdahl
Department of Physics, Box 530, Uppsala University, S-751 21 Uppsala, Sweden

M. G. Samant and S. S. P. Parkin
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120

N. Mårtensson, J. Nordgren, and B. Johansson
Department of Physics, Box 530, Uppsala University, S-751 21 Uppsala, Sweden

H. L. Skriver
Physics Department, Technical University of Denmark, DK-2800 Lyngby, Denmark

Received 12 April 1996; published in the issue dated 15 July 1996

High-resolution L3 x-ray absorption and emission spectra of Co and Cu in Co/Cu multilayers are shown to provide unique information on the occupied and unoccupied density of d states near buried interfaces. The d bands of both Co and Cu interfacial layers are shown to be considerably narrowed relative to the bulk metals, and for Cu interface layers the d density of states is found to be enhanced near the Fermi level. The experimental results are confirmed by self-consistent electronic structure calculations. © 1996 The American Physical Society.

© 1996 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.54.2917
DOI:
10.1103/PhysRevB.54.2917
PACS:
81.10.Bk, 68.35.Bs, 68.55.-a