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APS » Journals » Phys. Rev. B » Volume 54 » Issue 11
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Phys. Rev. B 54, 7716–7719 (1996)

Nonlocal screening effects in 2p x-ray photoemission spectroscopy of NiO (100)

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D. Alders
Department of Applied and Solid State Physics, Materials Science Centre, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands

F. C. Voogt and T. Hibma
Department of Chemical Physics, Materials Science Centre, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands

G. A. Sawatzky
Department of Applied and Solid State Physics, Materials Science Centre, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands

Received 1 March 1996; published in the issue dated 15 September 1996

We report on the layer thickness dependence of Ni 2p core-level line shapes of epitaxially grown, in a layer-by-layer fashion, NiO on a single-crystal MgO (100) substrate. The results demonstrate the sensitivity of the core-level line shape to the nearest as well as next-nearest-neighbor coordination number. The results are consistent with a recent theoretical study of nonlocal screening effects. © 1996 The American Physical Society.

© 1996 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.54.7716
DOI:
10.1103/PhysRevB.54.7716
PACS:
73.20.Dx
 
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