Phys. Rev. B 53, 5356–5362 (1996)Low-frequency noise in a phonon system of disordered insulatorsReceived 5 June 1995; published in the issue dated 1 March 1996 The influence of slowly relaxing structural defects on some nonelectric properties of solids is considered. Fluctuations of phonon occupation numbers caused by energy exchange between the phonon system and the slowly relaxing excitations are analyzed. Fluctuations of the structure parameters caused by structural relaxations are studied. A model for the low-frequency flicker noise of Brillouin light-scattering spectrum is suggested, which relates it to spatial and temporal fluctuations of the elasto-optic coefficient. The results are compared with existing experimental data. © 1996 The American Physical Society. © 1996 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.53.5356
DOI:
10.1103/PhysRevB.53.5356
PACS:
61.43.-j, 63.20.Pw, 78.35.+c
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