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Phys. Rev. B 52, 2038–2046 (1995)

Ion-surface interactions in the electron-stimulated desorption of Cl+ from Cl2/Si(111)-7×7

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W. C. Simpson and J. A. Yarmoff
Department of Physics, University of California, Riverside, California 92521
Material Sciences Division, Lawrence Berkeley Laboratory, Berkeley, California 94720

See Also: Erratum

Received 24 March 1995; published in the issue dated 15 July 1995

Cl+ electron-stimulated desorption energy and angular distributions are collected from Si(111)-7×7 surfaces exposed to Cl2. The results of these measurements are fitted to a model that accounts for variations in the surface work function, ion-surface image-charge interactions, and ion neutralization. From the fits, the strength of the image-charge interaction and the angular dependence of the neutralization are determined. The ideas presented here concerning the motion of ions in the vicinity of a surface are generally valid for all ion-surface interactions.

© 1995 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.52.2038
DOI:
10.1103/PhysRevB.52.2038
PACS:
34.20.-b, 68.35.-p, 79.20.Rf, 79.60.Bm

See Also

Erratum: W. C. Simpson and J. A. Yarmoff, Erratum: Ion-surface interactions in the electron-stimulated desorption of Cl+ from Cl2/Si(111)-7×7, Phys. Rev. B 52, 14273 (1995).