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APS » Journals » Phys. Rev. B » Volume 52 » Issue 24
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Phys. Rev. B 52, R17052–R17055 (1995)

X-ray diffuse-scattering study of interfacial morphology and conformal roughness in metallic multilayers

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R. Paniago, H. Homma, P. C. Chow, and S. C. Moss
Department of Physics, University of Houston, Houston, Texas 77204-5506

Z. Barnea
School of Physics, University of Melbourne, Parkville, Victoria 3052, Australia

S. S. P. Parkin
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099

D. Cookson
Australian Nuclear Science and Technology Organisation, Private Mail Bag 1, Menal 2234, Australia

Received 4 October 1995; published in the issue dated 15 December 1995

The nature of the interfacial roughness in Ni0.81Fe0.19/Au multilayers was studied using x-ray diffuse scattering. Using an image-plate detector this scattering could be observed to an extended momentum transfer. The roughness exponent and the cutoff length of the interfacial height-height self-correlation function could thereby be determined using a model of conformal roughness, for which the interfaces are smooth within the cutoff length. We also show that while the roughness is not conformal for short length scales, a transition to conformal behavior occurs from ∼25 to 100 Å.

© 1995 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.52.R17052
DOI:
10.1103/PhysRevB.52.R17052
PACS:
61.10.Lx, 68.35.Bs, 68.65.+g
 
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