Phys. Rev. B 51, 16164–16167 (1995)High-angle grain-boundary junctions in YBa2Cu3O7: Normal-state resistance and 1/f noiseReceived 11 August 1994; published in the issue dated 1 June 1995 We have investigated the normal-state resistance and the excess low-frequency (1/f) noise in 45° tilt [001] grain-boundary junctions in YBa2Cu3O7 thin films. A characteristic temperature dependence of the resistance fluctuations and a linear temperature dependence of the grain-boundary resistance (with a negative temperature coefficient) emerge as common features. These observations are quantitatively compared with a model of many, parallel conduction paths across the boundary, taking into account both temperature-independent and thermally activated transport processes. © 1995 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevB.51.16164
DOI:
10.1103/PhysRevB.51.16164
PACS:
74.25.Fy, 74.40.+k, 74.50.+r, 68.55.Ln
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