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Phys. Rev. B 50, 11275–11278 (1994)

Atomic imaging by x-ray-fluorescence holography and electron-emission holography: A comparative theoretical study

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P. M. Len, S. Thevuthasan, and C. S. Fadley
Department of Physics, University of California at Davis, Davis, California 95616

A. P. Kaduwela and M. A. Van Hove
Materials Sciences Division, Lawrence Berkeley Laboratory, Berkeley, California 94720

We consider from a theoretical viewpoint the direct imaging of atoms at and near the surfaces of solids by both x-ray-fluorescence holography (XFH) and electron-emission holography (EEH). The more ideal nature of x-ray scattering makes XFH images superior to those in single-energy EEH. The overlap of real and twin features for pairs of atoms at ±a can cause their XFH or EEH atomic images to cancel for certain combinations of wave vector and ‖a‖. The relative merits of XFH and EEH for structure studies are considered.

© 1994 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevB.50.11275
DOI:
10.1103/PhysRevB.50.11275
PACS:
61.14.Dc, 42.40.-i, 79.60.-i